Is a 30 kV CFE-SEM in STEM-in-SEM Mode Suitable for Characterizing Real Materials?
نویسندگان
چکیده
منابع مشابه
A 200-kV STEM/SEM Produces 1 Å SEM Resolution
Introduction “Second best no more” was the title of an article written by David C. Joy for Nature Materials [1]. The article was for highlighting a breakthrough made by a team formed between Brookhaven National Laboratory (BNL, USA) and Hitachi High Technologies Corporation (HHT, Japan). Sub-angstrom secondary electron (SE) images were obtained on a Hitachi HD-2700, which is a combined scanning...
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Accurate characterization of nanoparticles (NPs) with a high-resolution SEM with respect to morphology, shape and size distribution is carried out meanwhile routinely in more and more laboratories [1,2]. The valuable result of the metrological measurement of the NP size distribution -including traceability to the SI length unit was also recently demonstrated by exploiting the transmission mode ...
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1. Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China 2. School of Physics and Material Science, Anhui University, Hefei, Anhui 230601, P.R. China 3. School of Nuclear Science and Technology, University of Science and Technology of China, 96 Jinzhai Road, Hefei, ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2020
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927620017377